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“Low Energy Ion Scattering Spectroscopy (LEIS) can provide the elemental composition of the outermost atomic layer of a material by probing it with a 1 – 10 keV beam of noble gas ions. There isn’t another way to get this kind of information about the outermost layer of atoms in a material. Studying this layer plays a critical role in understanding a material’s catalytic, wetting, adhesion, frictional properties, etc. To our knowledge, the LEIS system, IONTOF's Qtac100, is the second Qtac in the USA. It is equipped with special sample preparation chambers. Furthermore, without breaking vacuum, sample can be transferred from and to the Kratos SUPRA XPS (X-ray Photoelectron Spectroscopy) system, which is a complementary surface analysis technique.

Our presenter is Dr. Philipp Bruner, Senior Research Scientist at IONTOF GmbH. Philip has been a research scientist at IONTOF for over 10 years now in the R &D section, working on ToF-SIMS and LEIS instrumentation”

Registration can be completed online. Email Jugessur with any questions.